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(1)Spurious-Free Analysis:By significantly eliminating spurious noise, the reflectometer produces clean measurement results that accelerate R&D analysis and improve defect inspection in production, contributing directly to improved efficiency.
(2)Ultra-High Sensitivity:The IRDiO Series achieves sensitivity down to ‒100 dB, capturing even minute reflections with exceptional clarity. This delivers highly accurate waveform analysis and long-term product reliability, with sensitivity approximately，1000× greater than its predecessor.
(3)Sharp Waveforms, Clear Results:High resolution and wide dynamic range work together to deliver sharp waveforms, exposing the smallest reflections beside strong signals for unmatched confidence in analysis.
(4)Simultaneous Wavelength Measurements:The Premiumcan simultaneously measure reflection loss at two wavelengths in just ten seconds, and when combined with the OPM Sensor Head, it evaluates both reflection and insertion loss in a single operation. This eliminates the need for reconnections, shortening tact time, and saving valuable lab space.
(5)Multi-Fiber Measurement:In conjunction with the Multi Unit, the Premium enables automatic measurement of up to 24 fibers, enabling efficient inspection and analysis of multiple fibers and optical devices.
(6)RL and IL Measurement in One Step: By combining the Premium with the OPM Sensor Head, users can automatically measure both return loss and insertion loss at two wavelengths simultaneously with a single system. With its spurious-free and high-sensitivity performance, the system clearly distinguishes reliable products (absence of reflection peaks) from defective ones (reflection peaks present). The control software also issues inspection reports to streamline quality management.
(7)Dual-Wavelength RL and IL Measurement for Multi-Fiber Devices:When paired with the Multi, the Premium enables automatic inspection of multiple fibers and devices such as splitters. It can measure return loss and insertion loss simultaneously across multiple ports. This eliminates the need for manual reconnections or switching, allowing multiple ports to be tested with a single button press for maximum efficiency.
(8)Component Position and Reflection Analysis in Optical Devices:With high spatial resolution, spurious-free operation, and sharp waveforms, the Premiumprecisely identifies component positions inside optical devices and measures the reflected light generated at their edges.
(9)Waveguide Internal Reflection and Propagation Loss Analysis:The Premiumseries accurately captures sharp peaks, clearly resolving small reflections and scattered light near strong coupling-point reflections. Propagation loss can be calculated directly from the slope of the return loss distribution, enabling precise waveguide analysis at a lower cost and in less time than with the conventional cutback method.
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